NSL Analytical’s state-of-the-art Scanning Electron Microscope (SEM) can provide high resolution imaging of samples at magnifications from 15-50,000x. Our large sample chamber is capable of accommodating samples up to approximately six inches in length by three inches wide. Trust SEM Analysis from NSL for accurate and timely service.
SEM Analysis Capabilities
Our Hitachi SU3500 Variable Pressure SEM/EDS can analyze your materials (even nonconductive types) without needing to apply a sputtered metal coating. We can analyze your feedstock powders, finished parts, coated or wet specimens and polymer materials. Plus, the SEM's superior imaging capability allows you to target specific areas of interest on your sample.
Remotely access material evaluations in real-time from your computer to watch, assist, or even drive the SEM. With this exciting technology, you can feel like you are in our lab during SEM analysis, from the comfort of your own office.
Our microscope capabilities include:
- Evaluations at 15-50,000x magnification
- SEM equipped with Energy Dispersive Spectroscopy (EDS) detector capable of semi-quantitative micro-chemical analysis and Rutherford Backscattering capabilities.
Image Analysis and EDS Services
You have the control to choose what’s important to you. NSL's SEM Analysis Services include:
- Fracture Analysis and Crack Origin
- Powder Shape Evaluation
- Coating ID and Thickness
- Elemental Mapping
- SEM/EDS services on a project or hourly basis.
Contact us for a quote or to talk to one of our in-house lab technicians to learn more.